Alle News

26. Oktober 2017; Tobias Wollandt

By: I. A. Fischer, A. Berrier, F. Hornung, M. Oehme, P. Zaumseil, G. Capellini, N. von den Driesch, D. Buca and J. Schulze
Title: Optical Critical Points of SixGe1-x-ySny alloys with high Si content
Link:  Semiconductor Science and Technology (2017)